Parametric identification of stochastic EMI sources based on near-field measurements

In this paper a 2D stochastic EMI source identification algorithm based on time domain measurements of electromagnetic near-field tangential components is presented. The radiating structure is considered as a set of simple electrical dipoles arranged on grid in the object plane. The autocorrelation and cross-correlation spectra are used for the characterization of stochastic field distribution. These characteristics are used to determine the distribution of dipole moments which is used to determine the parameters of the real radiation sources. The experimental data are processed with proposed parametric identification procedure for a spatial localization of equivalent dipoles and effective sources inside the structure.