• DocumentCode
    1767850
  • Title

    Ageing law for supercapacitors floating ageing

  • Author

    German, Reinhard ; Sari, Ali ; Venet, Pascal ; Zitouni, Y. ; Briat, Olivier ; Vinassa, Jean-Michel

  • Author_Institution
    AMPERE, Univ. de Lyon, Villeurbanne, France
  • fYear
    2014
  • fDate
    1-4 June 2014
  • Firstpage
    1773
  • Lastpage
    1777
  • Abstract
    Supercapacitors are energy storage systems appreciated as high power short duration power sources. As any electrochemical devices, supercapacitors are subject to ageing processes. Ageing is characterized by supercapacitors electrical performances loss (capacitance fades and Equivalent Series Resistance increases). In this article, we focus on capacitance fade with time for different sets of floating ageing constraints (constant temperature and voltage). This article deals with the best way for modeling capacitance fading with time for supercapacitors. Firstly, we present the approach of Eyring which predicts time for failure apparition. Then, we study two recent and uncommon ways for predicting capacitance evolution based on Langmuir isotherms and on the growth of a surface electrolyte interface. According to our study surface electrolyte interface approach appears more suitable for floating ageing modeling.
  • Keywords
    ageing; electrochemical electrodes; solid electrolytes; supercapacitors; Eyring approach; Langmuir isotherms; ageing law; capacitance evolution prediction; capacitance fade; electrochemical devices; energy storage systems; failure apparition; high power short duration power sources; supercapacitors electrical performances loss; supercapacitors floating ageing constraints; surface electrolyte interface; Adsorption; Aging; Capacitance; Electrodes; Solids; Supercapacitors; Surface impedance; flloating ageing; prediction; supercapacitor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics (ISIE), 2014 IEEE 23rd International Symposium on
  • Conference_Location
    Istanbul
  • Type

    conf

  • DOI
    10.1109/ISIE.2014.6864883
  • Filename
    6864883