• DocumentCode
    1767868
  • Title

    Influence of thermal cycling on supercapacitor performance fading during ageing test at constant voltage

  • Author

    Ayadi, Mounir ; Briat, Olivier ; Lallemand, Richard ; Coquery, G. ; Vinassa, Jean-Michel

  • Author_Institution
    IMS, Univ. Bordeaux, Talence, France
  • fYear
    2014
  • fDate
    1-4 June 2014
  • Firstpage
    1823
  • Lastpage
    1828
  • Abstract
    In this paper, we focus on impacts of thermal cycling ageing on supercapacitors performances at a constant voltage. We compare obtained results with those coming from simple calendar ageing at constant temperature and voltage. The comparison is based on physics modeling parameters evolution based on results from experimental measurements during calendar ageing up to 10000 h and 6000 h, 8000 h for thermal cycling tests. Finally, the impacts of thermal cycling interval is highlighted and quantified.
  • Keywords
    ageing; life testing; reliability; supercapacitors; ageing test; calendar ageing; constant voltage; physics modeling parameter; supercapacitor performance fading; thermal cycling ageing; thermal cycling test; time 10000 h; time 6000 h; time 8000 h; Aging; Calendars; Capacitance; Electrodes; Impedance; Supercapacitors; Temperature measurement; Supercapacitors; calendar ageing; thermal cycling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics (ISIE), 2014 IEEE 23rd International Symposium on
  • Conference_Location
    Istanbul
  • Type

    conf

  • DOI
    10.1109/ISIE.2014.6864892
  • Filename
    6864892