Title :
Studies of limitations to lateral brightness in high power diode lasers using spectrally-resolved mode profiles
Author :
Crump, P. ; Ekterai, M. ; Schultz, C.M. ; Erbert, Gotz ; Trankle, Gunther
Author_Institution :
Ferdinand-Braun-Inst., Leibniz-Inst. fur Hochstfrequenztechnik, Berlin, Germany
Abstract :
Efficient DFB broad-area lasers enable spectrally-resolved measurements of lateral field profiles to high powers, indicating brightness is limited by both increasing numbers of guided modes and degradation of beam quality of low order modes.
Keywords :
brightness; distributed feedback lasers; laser beams; laser modes; laser variables measurement; semiconductor lasers; beam quality degradation; efficient DFB broad-area lasers; high power diode lasers; lateral brightness; spectrally-resolved mode profiles; Brightness; Gratings; Laser beams; Laser modes; Measurement by laser beam; Power lasers; Semiconductor device measurement;
Conference_Titel :
Semiconductor Laser Conference (ISLC), 2014 International
Conference_Location :
Palma de Mallorca
Print_ISBN :
978-1-4799-5721-7
DOI :
10.1109/ISLC.2014.144
