• DocumentCode
    1767911
  • Title

    Scanning for light detection and Energy Centre Localization Methods assesment in vision systems for SHM

  • Author

    Rivas-Lopez, Moises ; Sergiyenko, Oleg ; Rivera-Castillo, Javier ; Flores-Fuentes, Wendy ; Rodriguez-Quinonez, Julio C. ; Hernandez-Balbuena, Daniel ; Taddei-Bringas, Jorge L.

  • Author_Institution
    Eng. Inst., Autonomous Univ. of Baja California, Mexicali, Mexico
  • fYear
    2014
  • fDate
    1-4 June 2014
  • Firstpage
    1955
  • Lastpage
    1960
  • Abstract
    In this research, six Energy Centre Localization Methods are assessed by Wilcoxon Signed Rank Test. Due to SHM is an upcoming tendency of determining the integrity of structures and development of strategies to prevent undesirable damage, it is necessary to detect a light emitter mounted on the structure under monitoring and calculate the energy centre localization. After a short introduction to the energy centre localization methods, a machine learning technique was applied to predict measurement errors and adjust non-linear variation for measurement accuracy improvement. An Optical Scanning System was enhanced by measurement at the optical signal energy centre and error adjustment by SVM algorithm. The theoretical methods principles, experimental development and validation are presented.
  • Keywords
    computerised monitoring; condition monitoring; image sensors; learning (artificial intelligence); measurement errors; optical scanners; optical sensors; optical variables measurement; reliability; structural engineering computing; support vector machines; SHM; SVM algorithm; Wilcoxon Signed Rank Test; energy centre localization method assesment; light detection scanning; light emitter detection; machine learning technique; measurement accuracy improvement; measurement error prediction; optical measurement; optical scanning system; vision system; Adaptive optics; Energy measurement; Light emitting diodes; Measurement uncertainty; Optical sensors; Stimulated emission; Support vector machines; Optical Scanning; SHM; SVM Regression; Signal Energy Centre;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics (ISIE), 2014 IEEE 23rd International Symposium on
  • Conference_Location
    Istanbul
  • Type

    conf

  • DOI
    10.1109/ISIE.2014.6864915
  • Filename
    6864915