Analytic modeling of memristor variability for robust memristor systems designs

In this paper we derive conditions for bounding the state change in a memristor due to an applied signal. The main memristor functionality is a programmable resistor, but its resistance changes due to the signal passing through it. Therefore, it is necessary to guarantee that any signal through the memristor causes a small resistance change as tolerable by the application. The derived conditions relate the desired bound on the resistance change to a bound on the signal flux through the memristor. We show examples for the case of a sinusoidal signal and demonstrate the impact of the derived conditions on the design of memristor-based systems.