Title :
Measurement of Temperature-Dependent Relaxation Oscillation Frequency and Linewidth Enhancement Factor of a 1550 nm VCSEL
Author :
Khan, N.A. ; Schires, K. ; Hurtado, A. ; Henning, I.D. ; Adams, M.J.
Author_Institution :
Sch. of Comput. Sci. & Electron. Eng., Univ. of Essex, Colchester, UK
Abstract :
In this paper, we present detailed measurements of the temperature-dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20°C to 60°C. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.
Keywords :
electromagnetic oscillations; light polarisation; semiconductor lasers; surface emitting lasers; VCSEL; measurement; polarization resolved linewidth enhancement factor; temperature -20 degC to 60 degC; temperature-dependent relaxation oscillation frequency; thermal effects; wavelength 1550 nm; Current measurement; Frequency measurement; Optical polarization; Temperature distribution; Temperature measurement; Vertical cavity surface emitting lasers; Linewidth enhancement factor; relaxation oscillation frequency (ROF); semiconductor lasers; vertical-cavity surface-emitting lasers (VCSELs);
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2013.2282759
