A random DEM technique with minimal element transition rate for high-speed DACs

Author

Peijun Wang ; Nan Sun

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA

fYear

2014

fDate

1-5 June 2014

Firstpage

1155

Lastpage

1158

Abstract

This paper presents a random dynamic element matching (DEM) technique for current-steering digital-to-analog converters (DACs). It randomizes the element selection process, and keeps the number of transitions to minimum. As a result, it does not introduce extra dynamic errors caused by inter-symbol interference (ISI). This technique also alleviates the impact of linear gradient errors due to the fabrication process. A behavioral Matlab model for 12-bit segmented current-steering DAC is developed. Simulation results proves that the proposed algorithm improves the DAC linearity effectively.

Keywords

digital-analogue conversion; intersymbol interference; DAC linearity; ISI; behavioral Matlab model; current-steering DAC; current-steering digital-to-analog converters; element selection process; fabrication process; high-speed DAC; intersymbol interference; linear gradient errors; minimal element transition rate; random DEM technique; random dynamic element matching technique; word length 12 bit; Computer architecture; Encoding; Heuristic algorithms; Linearity; Mathematical model; Solid state circuits; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems (ISCAS), 2014 IEEE International Symposium on

Conference_Location

Melbourne VIC

Print_ISBN

978-1-4799-3431-7

Type

conf

DOI

10.1109/ISCAS.2014.6865345

Filename

6865345