Abstracting Single Event Transient characteristics variations due to input patterns and fan-out

Due to shrinking feature sizes and significant reduction in noise margins, as CMOS technologies evolve toward ultra-deep sub-micron, digital circuits have become more susceptible to soft errors. Therefore, researchers have recently reported several approaches to model Single Event Transient (SET) propagation at gate or higher abstraction levels. However, contemporary techniques model only the possibility that SET pulse may be masked electrically, logically, or by time windowing. In this paper, the propagation induced pulse broadening (PIPB) phenomenon is further investigated and a new model which abstracts this phenomenon is proposed. This paper also investigates and abstracts the impact of input patterns and propagation paths on SET pulse width. Through electrical simulations, we validated our analysis.