Title :
Terahertz reflectometry of multi-layered paint thicknesses and estimation of particle sizes
Author :
Rahman, Aminur ; Rahman, A.K.
Author_Institution :
Appl. Res. & Photonics, Harrisburg, PA, USA
Abstract :
A terahertz reflectometer was designed and utilized for measuring paint panels comprised of layers of paint, primer and overcoat. Particle size of the paint additives were estimated by contour plot derived from 3D surface map.
Keywords :
nondestructive testing; optical design techniques; paints; particle size; reflectometers; reflectometry; thickness measurement; 3D surface map; contour plot; multilayered paint thicknesses; paint additives; paint panels; particle sizes; terahertz reflectometry; Atmospheric measurements; Current measurement; Paints; Particle measurements; Reflectivity; Surface treatment; Thickness measurement;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
