Title :
Fast methods for full-band mobility calculation
Author :
Stanojevic, Zlatan ; Filipovic, Lado ; Baumgartner, Oskar ; Kosina, Hans
Author_Institution :
Inst. for Microelectron., Tech. Univ. Wien, Vienna, Austria
Abstract :
Accurate band structure modeling is an essential ingredient in mobility modeling for any kind of semiconductor device or channel. This is particularly true for holes as the valence band of the most commonly used semiconductor materials is not even close to being parabolic. Instead, valence bands exhibit warped energy surfaces that simply cannot be approximated with parabolic valleys. To make matters worse, nanostructured channels can have large quantization energies resulting in complex, highly orientation-dependent kinetic behavior of both holes and electrons. In this work, we present an accurate and computationally efficient method for calculating channel low-feld mobilities based on a numeric band structure from a k·p model.
Keywords :
carrier mobility; k.p calculations; nanostructured materials; semiconductors; valence bands; band structure modeling; full-band mobility calculation; k·p model; nanostructured channels; orientation-dependent kinetic behavior; quantization energies; semiconductor channel; semiconductor device; semiconductor materials; valence band; warped energy surfaces; Computational modeling; Couplings; Phonons; Rough surfaces; Scattering; Silicon; Surface roughness;
Conference_Titel :
Computational Electronics (IWCE), 2014 International Workshop on
Conference_Location :
Paris
DOI :
10.1109/IWCE.2014.6865821