• DocumentCode
    1769623
  • Title

    Influence of anharmonic phonon decay on self-heating in Si nanowire transistors

  • Author

    Rhyner, R. ; Luisier, Mathieu

  • Author_Institution
    Integrated Syst. Lab., ETH Zurich, Zürich, Switzerland
  • fYear
    2014
  • fDate
    3-6 June 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Phonon-phonon scattering is included in an atomistic and full-band quantum transport approach where electron and phonon transport are fully coupled based on the Non-equilibrium Green´s function formalism. The investigation of self-heating effects in ultra-scaled Si nanowire transistors shows that the artificial accumulation of high energy phonons caused by electron relaxations close to the drain region is softened due to the phonon decay process. As a consequence, the device current is increased in the ON-state and the effective lattice temperature is reduced.
  • Keywords
    Green´s function methods; MOSFET; elemental semiconductors; nanowires; silicon; MOSFET; Si; anharmonic phonon decay; artificial accumulation; atomistic approach; drain region; electron relaxations; electron transport; full-band quantum transport approach; high energy phonons; metal-oxide-semiconductor field-effect-transistors; non-equilibrium Green function formalism; phonon transport; phonon-phonon scattering; self-heating; ultra-scaled nanowire transistors; Lattices; Logic gates; Optical scattering; Phonons; Silicon; Transistors; Anharmonic phonon decay; NEGF; atomistic; full-band; quantum transport; self-heating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics (IWCE), 2014 International Workshop on
  • Conference_Location
    Paris
  • Type

    conf

  • DOI
    10.1109/IWCE.2014.6865826
  • Filename
    6865826