DocumentCode
1769623
Title
Influence of anharmonic phonon decay on self-heating in Si nanowire transistors
Author
Rhyner, R. ; Luisier, Mathieu
Author_Institution
Integrated Syst. Lab., ETH Zurich, Zürich, Switzerland
fYear
2014
fDate
3-6 June 2014
Firstpage
1
Lastpage
3
Abstract
Phonon-phonon scattering is included in an atomistic and full-band quantum transport approach where electron and phonon transport are fully coupled based on the Non-equilibrium Green´s function formalism. The investigation of self-heating effects in ultra-scaled Si nanowire transistors shows that the artificial accumulation of high energy phonons caused by electron relaxations close to the drain region is softened due to the phonon decay process. As a consequence, the device current is increased in the ON-state and the effective lattice temperature is reduced.
Keywords
Green´s function methods; MOSFET; elemental semiconductors; nanowires; silicon; MOSFET; Si; anharmonic phonon decay; artificial accumulation; atomistic approach; drain region; electron relaxations; electron transport; full-band quantum transport approach; high energy phonons; metal-oxide-semiconductor field-effect-transistors; non-equilibrium Green function formalism; phonon transport; phonon-phonon scattering; self-heating; ultra-scaled nanowire transistors; Lattices; Logic gates; Optical scattering; Phonons; Silicon; Transistors; Anharmonic phonon decay; NEGF; atomistic; full-band; quantum transport; self-heating;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Electronics (IWCE), 2014 International Workshop on
Conference_Location
Paris
Type
conf
DOI
10.1109/IWCE.2014.6865826
Filename
6865826
Link To Document