DocumentCode
1769633
Title
Ultrasensitive measurement of MEMS cantilever displacement below the photon shot noise limit
Author
Lawrie, B.J. ; Pooser, R.C.
Author_Institution
Quantum Inf. Sci. Group, Oak Ridge Nat. Lab., Oak Ridge, TN, USA
fYear
2014
fDate
8-13 June 2014
Firstpage
1
Lastpage
2
Abstract
We demonstrate sub-shot-noise microcantilever displacement sensitivity using simple differential measurements with multi-spatial-mode squeezed light, a result that may be critical for ultra-trace sensing and imaging applications.
Keywords
cantilevers; displacement measurement; micromechanical devices; optical squeezing; shot noise; MEMS cantilever displacement; differential measurements; imaging applications; multispatial-mode squeezed light; photon shot noise limit; shot-noise microcantilever displacement sensitivity; ultra-trace sensing applications; ultrasensitive measurement; Displacement measurement; Micromechanical devices; Noise; Noise measurement; Optical noise; Optical sensors; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location
San Jose, CA
Type
conf
Filename
6988457
Link To Document