Title :
Ultrasensitive measurement of MEMS cantilever displacement below the photon shot noise limit
Author :
Lawrie, B.J. ; Pooser, R.C.
Author_Institution :
Quantum Inf. Sci. Group, Oak Ridge Nat. Lab., Oak Ridge, TN, USA
Abstract :
We demonstrate sub-shot-noise microcantilever displacement sensitivity using simple differential measurements with multi-spatial-mode squeezed light, a result that may be critical for ultra-trace sensing and imaging applications.
Keywords :
cantilevers; displacement measurement; micromechanical devices; optical squeezing; shot noise; MEMS cantilever displacement; differential measurements; imaging applications; multispatial-mode squeezed light; photon shot noise limit; shot-noise microcantilever displacement sensitivity; ultra-trace sensing applications; ultrasensitive measurement; Displacement measurement; Micromechanical devices; Noise; Noise measurement; Optical noise; Optical sensors; Probes;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
