DocumentCode
1770149
Title
Sparsity-based Ankylography: Recovering 3D structures from a single-shot 2D scattered intensity
Author
Mutzafi, Maor ; Shechtman, Yoav ; Cohen, Oren ; Eldar, Yonina C. ; Segev, Mordechai
Author_Institution
Phys. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
fYear
2014
fDate
8-13 June 2014
Firstpage
1
Lastpage
2
Abstract
We present an algorithmic paradigm for deciphering the 3D structure of a molecule from the far-field intensity of scattered x-ray photons before the molecule disintegrates. Our approach enables surpassing current limits on recoverable information capacity.
Keywords
X-ray crystallography; X-ray scattering; 3D structure; algorithmic paradigm; scattered X-ray photons; single-shot 2D scattered intensity; sparsity-based Ankylography; Free electron lasers; Image reconstruction; Imaging; Periodic structures; Three-dimensional displays; X-ray imaging; X-ray lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location
San Jose, CA
Type
conf
Filename
6988768
Link To Document