Electron beam profile instrument based on FBGs

The transversal profile of a charged particle beam, its position, its centroid location, its focus or flatness depends on the instrument operating conditions or on the beam exit set up. Prove of concept of a new type of charged particle beam diagnostics based on FBGs was demonstrated. Its operating principle relays on the measurement of the central wavelengths change of a matrix of FBG sensors as function of the temperature, following their exposure to an electron beam. Periodically, the exposure of sensors is stopped and they are forced cooled to a reference temperature against which the temperature influencing each sensor during beam exposure is evaluated. Commercial available FBGs and FBGs written in radiation resistant optical fibers were tested under electron beam irradiation, in relation to this application.