Title :
Design of fuze test system based on MCU and LabVIEW
Author :
Zhipeng Hu ; Xingchun Liu
Author_Institution :
Sch. of Electron. & Inf. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
A fuze test system based on MCU and LabVIEW is introduced for testing the fuze´s working state. This system consist of the central controlling system based on C8051F020 and the host computer procedure based on LabVIEW. It can be used to test the static parameter and the dynamic signal of fuze. In condition, self-check and calibration are available. The host computer procedure can realize the automatic control, uploading, printing and saving. Both parts are connected by serial port. It has been proved that the system works correctly.
Keywords :
automatic test equipment; calibration; fuzes (detonation); microcontrollers; virtual instrumentation; C8051F020; LabVIEW; MCU; automatic control; calibration; central controlling system; fuze test system; host computer procedure; printing; Current measurement; Electrical resistance measurement; Impedance measurement; Oscilloscopes; Power measurement; Resistance; Voltage measurement; LabVIEW; MCU; fuze; test;
Conference_Titel :
Advanced Research and Technology in Industry Applications (WARTIA), 2014 IEEE Workshop on
Conference_Location :
Ottawa, ON
DOI :
10.1109/WARTIA.2014.6976529
