DocumentCode :
1770940
Title :
Orientation-controlled dielectrophoretic alignment of silicon microrod on a substrate with high positional accuracy
Author :
Shibata, Akihide ; Watanabe, Keiji ; Sato, Takuya ; Kotaki, Hiroshi ; Schuele, Paul J. ; Crowder, Mark A. ; Zhan, Changqing ; Hartzell, John W. ; Nakatani, Ryoichi
Author_Institution :
Adv. Technol. Res. Labs., Sharp Corp., Tenri, Japan
fYear :
2014
fDate :
19-20 June 2014
Firstpage :
1
Lastpage :
2
Abstract :
We demonstrate the orientation-controlled dielectrophoretic alignment of asymmetric Si microrods on a glass substrate with an asymmetric pair of electrodes. By applying AC bias to the electrodes, over 80% of the Si microrods align on the electrode pair so that a particular end of the microrod relates to a certain part of the electrode; the thick and thin ends overlap the thick and thin electrodes, respectively. Furthermore, the orientation of the top and bottom face of the Si microrod is also controllable when the thicknesses of the dielectric film on the top and bottom faces are different.
Keywords :
electrochemical electrodes; electrophoresis; elemental semiconductors; rods (structures); silicon; SEM; Si; SiO2; asymmetric silicon microrods; dielectric film; electrodes; glass substrate; optical microspcopy; orientation-controlled dielectrophoretic alignment; Dielectrophoresis; Electrodes; Face; Microscopy; Nanowires; Silicon; Substrates; dielectrophoretic alignment; orientation-controlled alignment; silicon microrod;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Future of Electron Devices, Kansai (IMFEDK), 2014 IEEE International Meeting for
Conference_Location :
Kyoto
Print_ISBN :
978-1-4799-3614-4
Type :
conf
DOI :
10.1109/IMFEDK.2014.6867093
Filename :
6867093
Link To Document :
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