• DocumentCode
    1770940
  • Title

    Orientation-controlled dielectrophoretic alignment of silicon microrod on a substrate with high positional accuracy

  • Author

    Shibata, Akihide ; Watanabe, Keiji ; Sato, Takuya ; Kotaki, Hiroshi ; Schuele, Paul J. ; Crowder, Mark A. ; Zhan, Changqing ; Hartzell, John W. ; Nakatani, Ryoichi

  • Author_Institution
    Adv. Technol. Res. Labs., Sharp Corp., Tenri, Japan
  • fYear
    2014
  • fDate
    19-20 June 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We demonstrate the orientation-controlled dielectrophoretic alignment of asymmetric Si microrods on a glass substrate with an asymmetric pair of electrodes. By applying AC bias to the electrodes, over 80% of the Si microrods align on the electrode pair so that a particular end of the microrod relates to a certain part of the electrode; the thick and thin ends overlap the thick and thin electrodes, respectively. Furthermore, the orientation of the top and bottom face of the Si microrod is also controllable when the thicknesses of the dielectric film on the top and bottom faces are different.
  • Keywords
    electrochemical electrodes; electrophoresis; elemental semiconductors; rods (structures); silicon; SEM; Si; SiO2; asymmetric silicon microrods; dielectric film; electrodes; glass substrate; optical microspcopy; orientation-controlled dielectrophoretic alignment; Dielectrophoresis; Electrodes; Face; Microscopy; Nanowires; Silicon; Substrates; dielectrophoretic alignment; orientation-controlled alignment; silicon microrod;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future of Electron Devices, Kansai (IMFEDK), 2014 IEEE International Meeting for
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4799-3614-4
  • Type

    conf

  • DOI
    10.1109/IMFEDK.2014.6867093
  • Filename
    6867093