Title :
Direct observation of electromagnetic near field in silicon nanophotonics devices using scanning thermal microscopy (SThM) technique
Author :
Grajower, Meir ; Stern, Liron ; Desiatov, Boris ; Goykhman, Ilya ; Levy, Uriel
Author_Institution :
Dept. of Appl. Phys., Hebrew Univ. of JerusalemJerusalem, Jerusalem, Israel
Abstract :
We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.
Keywords :
elemental semiconductors; nanophotonics; near-field scanning optical microscopy; silicon; Si; electromagnetic near field; nanoscale resolution; near field scanning thermal microscopy; optical near field; silicon nanophotonics devices; Absorption; Microscopy; Nanoscale devices; Optical imaging; Optical waveguides; Silicon; Temperature measurement;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
