DocumentCode :
1771611
Title :
Surface antireflection studies of GaN nanostructures with various effective refractive index profiles
Author :
Lu Han ; Hongping Zhao
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH, USA
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
1
Lastpage :
2
Abstract :
GaN nanostructures with various effective refractive index profiles were numerically studied as broadband omnidirectional antireflection structures for concentrator photovoltaics, as compared to that of the conventional GaN with flat surface.
Keywords :
III-V semiconductors; antireflection coatings; gallium compounds; nanostructured materials; refractive index; wide band gap semiconductors; GaN; broadband omnidirectional antireflection structures; concentrator photovoltaics; effective refractive index profiles; nanostructures; surface antireflection; Gallium nitride; Nanostructures; Optical surface waves; Reflection; Refractive index; Surface treatment; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
Type :
conf
Filename :
6989520
Link To Document :
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