Title :
Extracting the complex optical conductivity of true two-dimensional layers by ellipsometry
Author :
You-Chia Chang ; Chang-Hua Liu ; Zhaohui Zhong ; Norris, Theodore B.
Author_Institution :
Center for Ultrafast Opt. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
A simple and robust technique to extract the complex optical conductivity of truly two-dimensional materials is developed. Applying the method to chemical-vapor-deposited graphene, we extract the complex conductivity, including Fermi level and scattering time.
Keywords :
Fermi level; chemical vapour deposition; graphene; optical conductivity; C; Fermi level; chemical-vapor-deposited graphene; complex optical conductivity; ellipsometry; scattering time; two-dimensional layers; two-dimensional materials; Adaptive optics; Conductivity; Graphene; Optical imaging; Optical reflection; Optical scattering; Optical variables measurement;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2014 Conference on
Conference_Location :
San Jose, CA
