• DocumentCode
    1772260
  • Title

    Ultrafast imaging of shocked material dynamics with X-ray fee electron laser pulses

  • Author

    Sandberg, R.L. ; Bolme, C. ; Ramos, K. ; McCulloch, Q. ; Martinez, Ricardo ; Hamilton, V. ; Pierce, T. ; Greenfield, M. ; McGrane, S. ; Barber, J.L. ; Abbey, B. ; Schropp, A. ; Seiboth, F. ; Heiman, P. ; Nagler, B. ; Galtier, E. ; Granados, E.

  • Author_Institution
    Los Alamos Nat. Lab., Los Alamos, NM, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We present the first single-shot images of a laser-driven shock wave interacting with micron-scale materials inhomogeneities taken with an X-ray free electron laser. Materials dynamics under high strain-rate loading is important to a range of problems.
  • Keywords
    X-ray lasers; high-speed optical techniques; shock waves; X-ray fee electron laser pulse; laser-driven shock wave interaction; material dynamics; micronscale material inhomogeneity; shocked material dynamics; single-shot images; strain-rate loading; ultrafast imaging; Detectors; Electric shock; Free electron lasers; Laser beams; Materials; X-ray imaging; X-ray lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2014 Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • Filename
    6989852