Clock Glitch Attacks in the Presence of Heating

Fault attacks have been widely studied in the past but most of the literature describes only individual fault-injection techniques such as power/clock glitches, EM pulses, optical inductions, or heating/cooling. In this work, we investigate combined fault attacks by performing clock-glitch attacks under the impact of heating. We performed practical experiments on an 8-bit AVR microcontroller which resulted in the following findings. First, we identified that the success rate of glitch attacks performed at an ambient temperature of 100°C is higher than under room temperature. We were able to induce more faults and significantly increase the time frame when the device is susceptible to glitches which makes fault attacks easier to perform in practice. Second, and independently of the ambient temperature, we demonstrate that glitches cause individual instructions to repeat, we are able to add new random instructions, and we identified that opcode gets modified such that address registers of individual instructions get changed. Beside these new results, this is the first work that reports results of combined glitch and thermo attacks.