Title :
Quality assurance in memory built-in self-test tools
Author :
Au, Albert ; Pogiel, Artur ; Rajski, Janusz ; Sydow, Piotr ; Tyszer, Jerzy ; Zawada, Justyna
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
Abstract :
In the paper, two methods of ensuring high quality of the memory built-in self-test tools are presented. The described ideas illustrate general methods and are applicable to any commercial memory BIST tool. The first solution describes controller emulation in order to validate each step of the real controller´s operations. The second approach presents a way to determine the test algorithms´ fault coverage by means of the memory fault simulator. The experimental results show functional benefits and effectiveness of the proposed solutions.
Keywords :
built-in self test; integrated memory circuits; quality assurance; controller emulation; memory built-in self-test tools; memory fault simulator; quality assurance; Built-in self-test; Circuit faults; Decoding; Emulation; Hardware design languages; Integrated circuit modeling; Libraries;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4799-4560-3
DOI :
10.1109/DDECS.2014.6868760
