Title :
Sources of bias in EDA tools and its influence
Author :
Fiser, Petr ; Schmidt, Jan ; Balcarek, Jiri
Author_Institution :
Fac. of Inf. Technol., Czech Tech. Univ. in Prague, Prague, Czech Republic
Abstract :
In this paper we present an experimental analysis of robustness of Electronic Design Automation (EDA) tools, with respect to different seemingly unimportant aspects (bias) introduced by the designer, “from outside”. The algorithms employed in EDA tools should be immune to these completely, since such aspects do not carry any useful information - source files differing in these aspects are semantically equivalent. However, we show that most of the studied tools are seriously sensitive here, much more than ever reported. The results indicate, that experiments conducted to evaluate the performance of EDA tools must take such behavior into consideration. Also the notion of a benchmark is questioned.
Keywords :
electronic design automation; EDA tools; electronic design automation tools; source files; Algorithm design and analysis; Automatic test pattern generation; Benchmark testing; Field programmable gate arrays; Robustness; Table lookup; Vectors; EDA tools; logic synthesis; randomness; robustness;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
Conference_Location :
Warsaw
Print_ISBN :
978-1-4799-4560-3
DOI :
10.1109/DDECS.2014.6868803