An approach towards selection of the oscillation frequency for oscillation test of analog ICs

Author

Kovac, Martin ; Arbet, Daniel ; Nagy, Gabriel ; Stopjakova, Viera

Author_Institution

Inst. of Electron. & Photonics, Slovak Univ. of Technol., Bratislava, Slovakia

fYear

2014

fDate

23-25 April 2014

Firstpage

266

Lastpage

267

Abstract

The paper deals with a new approach to selection of the optimum value of the oscillation frequency towards increasing the efficiency of the oscillation-based test methods in covering hard-detectable short faults in nanoscale technologies. For this purpose, the Describing-Function analysis was used to calculate of the oscillation frequency of a simple oscillator (an analog circuit under test) modeled in MATLAB. Accuracy of the model was evaluated through comparison of computed parameters to parameters achieved for the same circuit in Cadence.

Keywords

analogue integrated circuits; fault diagnosis; integrated circuit testing; nanoelectronics; oscillators; Cadence; Matlab; analog ICs; analog circuit under test; describing-function analysis; hard-detectable short faults; nanoscale technology; oscillation frequency selection; oscillation-based test methods; Accuracy; Circuit faults; MATLAB; Mathematical model; Nanoscale devices; Oscillators; Testing; Describing-function; analog test; oscillation test;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on

Conference_Location

Warsaw

Print_ISBN

978-1-4799-4560-3

Type

conf

DOI

10.1109/DDECS.2014.6868805

Filename

6868805