• DocumentCode
    1772885
  • Title

    On the in-field test of Branch Prediction Units using the correlated predictor mechanism

  • Author

    Gaudesi, M. ; Saleem, S. ; Sanchez, E. ; Reorda, M. Sonza ; Tanowe, E.

  • Author_Institution
    Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
  • fYear
    2014
  • fDate
    23-25 April 2014
  • Firstpage
    286
  • Lastpage
    289
  • Abstract
    Branch Prediction Units (BPUs) are widely used to reduce the performance penalties caused by branch instructions in pipelined processors. BPUs may be implemented in different forms: the Branch History Table (BHT) is an effective solution when the goal is predicting the result of conditional branches. In this paper we propose a method to generate test programs able to detect faults affecting the memory existing within a BHT implementing the correlated predictors approach. Our method is particularly suited to be used for the in-field test of a processor and allows detecting any stuck-at fault in the BPU memory. The method does not require the detailed knowledge of the BPU implementation, but only relies on the key parameters of its architecture. We gathered experimental results using the SimpleScalar environment.
  • Keywords
    computer architecture; correlation methods; integrated circuit testing; logic testing; BPU memory; Correlated Predictor Mechanism; SimpleScalar environment; branch prediction units; fault detection; in-field test; stuck-at fault; Circuit faults; Computer architecture; History; Program processors; Radiation detectors; Shift registers; Testing; branch history table; branch prediction unit; functional test; sbst;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
  • Conference_Location
    Warsaw
  • Print_ISBN
    978-1-4799-4560-3
  • Type

    conf

  • DOI
    10.1109/DDECS.2014.6868811
  • Filename
    6868811