DocumentCode
1772885
Title
On the in-field test of Branch Prediction Units using the correlated predictor mechanism
Author
Gaudesi, M. ; Saleem, S. ; Sanchez, E. ; Reorda, M. Sonza ; Tanowe, E.
Author_Institution
Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
fYear
2014
fDate
23-25 April 2014
Firstpage
286
Lastpage
289
Abstract
Branch Prediction Units (BPUs) are widely used to reduce the performance penalties caused by branch instructions in pipelined processors. BPUs may be implemented in different forms: the Branch History Table (BHT) is an effective solution when the goal is predicting the result of conditional branches. In this paper we propose a method to generate test programs able to detect faults affecting the memory existing within a BHT implementing the correlated predictors approach. Our method is particularly suited to be used for the in-field test of a processor and allows detecting any stuck-at fault in the BPU memory. The method does not require the detailed knowledge of the BPU implementation, but only relies on the key parameters of its architecture. We gathered experimental results using the SimpleScalar environment.
Keywords
computer architecture; correlation methods; integrated circuit testing; logic testing; BPU memory; Correlated Predictor Mechanism; SimpleScalar environment; branch prediction units; fault detection; in-field test; stuck-at fault; Circuit faults; Computer architecture; History; Program processors; Radiation detectors; Shift registers; Testing; branch history table; branch prediction unit; functional test; sbst;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
Conference_Location
Warsaw
Print_ISBN
978-1-4799-4560-3
Type
conf
DOI
10.1109/DDECS.2014.6868811
Filename
6868811
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