• DocumentCode
    1773498
  • Title

    A new low-Ag lead free solder alloy and the reliability

  • Author

    Sun Fenglian ; Liu Yang

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Harbin Univ. of Sci. & Technol., Harbin, China
  • fYear
    2014
  • fDate
    21-23 Oct. 2014
  • Firstpage
    440
  • Lastpage
    443
  • Abstract
    This paper introduces a new low-Ag lead free solder alloy which possesses lower cost and higher performance. Also, the new alloy shows some satisfactory properties in solderability, HTS aging resistance, thermal cycling resistance, Shear strength, vibration shock aging and electromigration resistance. Experiments results indicated that both Ni and Bi elements in the low-Ag lead free solder alloy could enhance the solderability and aging resistance. Especially, addition of proper Bi element in the new solder alloy could improve the wettability between solder and pad, decrease the melting point of solder. Adding proper Ni elements in the new solder alloy could restrain the growth of IMC and refine grain size. According to the microstrcture morphology and fracture surface analysis, there is no honeycomb existence in the novel solder alloy after HTS aging and fine IMC grains exist in. Farther, fine grain size enhances the electromigration resistance, thermal shock resistance and shear strengthen.
  • Keywords
    electromigration; fracture; reliability; shear strength; solders; thermal resistance; vibrations; HTS aging resistance; electromigration resistance; fracture surface analysis; grain size; low-silver lead free solder alloy; melting point; microstrcture morphology; reliability; shear strength; solderability; thermal cycling resistance; vibration shock aging; wettability; Aging; Bismuth; Microstructure; Nickel; Resistance; Soldering; lead free; reliability; solder; solderability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Strategic Technology (IFOST), 2014 9th International Forum on
  • Conference_Location
    Cox´s Bazar
  • Print_ISBN
    978-1-4799-6060-6
  • Type

    conf

  • DOI
    10.1109/IFOST.2014.6991158
  • Filename
    6991158