Enhancement in IEEE 1500 standard for at-speed functional testing

Author

Ali, Ghazanfar ; Hussin, Fawnizu Azmadi ; Ali, Noohul Basheer Zain ; Hamid, Nor Hisham

Author_Institution

Electr. & Electron. Eng. Dept., Univ. Teknol. Petronas, Tronoh, Malaysia

fYear

2014

fDate

3-5 June 2014

Firstpage

1

Lastpage

5

Abstract

System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in normal functional mode. In this paper, an enhancement of the existing IEEE 1500 standard for functional testing, during functional mode of operation, is proposed.

Keywords

IEEE standards; industrial property; integrated circuit design; integrated circuit testing; system-on-chip; IEEE 1500 standard; IP blocks; SoC testing; at-speed functional testing; complex system; functional testing; intellectual property blocks; normal functional mode; system on chip; test mode; Discrete Fourier transforms; Shift registers; Standards; System-on-chip; Testing; Vectors; DFT; Functional testing; IEEE 1500 standard;

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent and Advanced Systems (ICIAS), 2014 5th International Conference on

Conference_Location

Kuala Lumpur

Print_ISBN

978-1-4799-4654-9

Type

conf

DOI

10.1109/ICIAS.2014.6869507

Filename

6869507