A method for computing the short term flicker severity(Pst) based on EMD and TEO fluctuating feature extraction

Traditional flicker detection of IEC needs design multiple filters, the process is complex and the computational burden is heavy. A method for computing the short term flicker severity based on EMD (empirical mode decomposition) and TEO (Teager energy operator) is proposed in this paper. It extracts voltage flicker envelop which captures the main flicker characteristic from the voltage signal of PCC(Point of Common Coupling) by using the dynamic phasor method. Then it divides flicker envelop of the non-stationary signal into several stationary components and negligible remaining with EMD, identifies the frequency and amplitude of each component with TEO and then computes the flicker severity of power consumer. The validity of the method is verified by simulation finally.