DocumentCode :
1774590
Title :
An online Vce measurement and temperature estimation method for high power IGBT module in normal PWM operation
Author :
Ghimire, Pramod ; de Vega, Angel Ruiz ; Beczkowski, Szymon ; Munk-Nielsen, Stig ; Rannested, Bjorn ; Thogersen, Paul Bach
Author_Institution :
Dept. of Energy Technol., Aalborg Univ., Aalborg, Denmark
fYear :
2014
fDate :
18-21 May 2014
Firstpage :
2850
Lastpage :
2855
Abstract :
An on-state collector-emitter voltage (Vce) measurement and thereby an estimation of average temperature in space for high power IGBT module is presented while power converter is in operation. The proposed measurement circuit is able to measure both high and low side IGBT and anti parallel diode voltages for a half bridge module which are also used to monitor the electrical degradation of the module. The Vce load current is proposed to estimate the variation of average temperature in space at every fundamental cycle of sinusoidal loading current. Initially, the calibration of voltage and junction temperature for load current level is presented and a trend of change in calibration factor for the IGBT is presented. Finally, the variation in temperature for sinusoidal variation of current is presented at initial stage and after an ageing of the IGBT. The measurement technique is simple and easy to implement into a gate driver for field applications.
Keywords :
bridge circuits; calibration; computerised monitoring; insulated gate bipolar transistors; power convertors; power semiconductor diodes; temperature measurement; voltage measurement; IGBT diode voltage measurement; anti parallel diode voltage measurement; electrical degradation monitoring; gate driver; half bridge module; high power IGBT module; junction temperature calibration; load current level; measurement circuit; on-state collector-emitter voltage measurement; online Vce measurement; power converter; sinusoidal loading current; temperature estimation method; voltage calibration; Digital signal processing; Insulated gate bipolar transistors; Logic gates; Measurement techniques; Optical fiber communication; Optical variables measurement; Reliability; IGBT power module; junction temperature; real time monitoring; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA), 2014 International
Conference_Location :
Hiroshima
Type :
conf
DOI :
10.1109/IPEC.2014.6870085
Filename :
6870085
Link To Document :
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