Title :
Integrated near field scaning system for high frequency deivces
Author :
Hengxu Li ; Boyuan Zhu ; Varnoosfadeani, M. Vatankhah ; Junwei Lu
Author_Institution :
Queensland Micro- & Nanotechnol. Centre, Griffith Univ., Brisbane, QLD, Australia
Abstract :
In electromagnetic interference (EMI) investigation, localization of real EMI sources in the near-field region is always in concern. This paper introduces an integrated near-field scanning system (INFSS) that handles electromagnetic near-field measurement of arbitrary three-dimension (3D) shape of high frequency devices in conjunction with numerical modelling and simulation results. It performs both finite element method (FEM) based numerical simulation and 3D near-field scanning function that help engineer to increase the project development efficiency and reduce the development time cost. A case study of a dual mode switch parasitic antenna is presented from design to measurement using INFSS.
Keywords :
antennas; electromagnetic interference; numerical analysis; 3D near-field scanning function; EMC; EMI sources; INFSS; arbitrary three-dimension shape; development time cost; dual mode switch parasitic antenna; electromagnetic compatibility; electromagnetic interference; electromagnetic near-field measurement; high frequency devices; integrated near-field scanning system; near-field region; numerical simulation; project development; Antenna measurements; Antennas; Finite element analysis; Numerical models; Solid modeling; Switches; Three-dimensional displays; 3D scanning; FEM simulation; integrated system; near-field;
Conference_Titel :
Antennas and Propagation (APCAP), 2014 3rd Asia-Pacific Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4799-4355-5
DOI :
10.1109/APCAP.2014.6992801
