DocumentCode
177703
Title
Sufficient Statistics Feature Mapping over Deep Boltzmann Machine for Detection
Author
Chao Zhang ; Xiong Li ; Junchi Yan ; Qui, S. ; Yu Wang ; Chunhua Tian ; Yuming Zhao
Author_Institution
IBM Res., Beijing, China
fYear
2014
fDate
24-28 Aug. 2014
Firstpage
827
Lastpage
832
Abstract
As an important and fundamental methodology in the fields of pattern recognition and image processing, learning middle level feature has attracted increasing interest during the recent years, where generative feature mapping has shown highly completive performance in diverse applications. In this paper, a middle level feature representation is proposed based on Deep Boltzmann Machine (DBM) and sufficient statistics (SS) feature mapping for detection. In the approach, DBM is employed to model data distribution and the hidden information inferred by DBM together with other informative variables are then exploited by SS to form the middle level features. The features, learnt from data, can be fed to standard classifiers for classification. In order to evaluate the performance of our method, we apply our feature mapping method to two challenging tasks: (1) contour detection through distinguishing border and non-border pixels, (2) sales pipeline prediction, which predicts the winning propensity of the ongoing sales opportunity in the pipeline. In comparison with other leading methods in the literature on the Berkeley Segmentation Dataset and Sales Pipeline Database (SPDB), our proposed algorithm performs favorably against state-of-the-art methods in terms of effectiveness and efficiency.
Keywords
Boltzmann machines; image recognition; learning (artificial intelligence); visual databases; Berkeley segmentation dataset; DBM; SPDB; SS feature mapping; border pixels; contour detection; data distribution model; deep Boltzmann machine; diverse applications; generative feature mapping; hidden information; image processing; informative variables; middle level feature learning; middle level feature representation; nonborder pixels; pattern recognition; sales pipeline database; standard classifiers; sufficient statistics feature mapping; winning propensity; Business; Compass; Feature extraction; Joints; Pattern recognition; Pipelines; Predictive models;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location
Stockholm
ISSN
1051-4651
Type
conf
DOI
10.1109/ICPR.2014.152
Filename
6976862
Link To Document