DocumentCode :
1777143
Title :
InGaAs/GaAsSb interband tunneling FETs as tunable RF detectors
Author :
Li, Wenyuan ; yu, tao ; Hoyt, Justin ; Fay, Patrick
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
fYear :
2014
fDate :
22-25 June 2014
Firstpage :
21
Lastpage :
22
Abstract :
III-V based tunnel FETs (TFETs) have attracted wide interest for the promise of achieving sub-thermionic switching slopes (<; 60 mV/decade) to enable continued power-constrained scaling for logic. These same characteristics, however also offer advantages for non-logic applications; in particular, the strong nonlinearity in the transfer characteristics - a function of the energy filtering inherent with interband tunneling - makes these devices attractive candidates for nonlinear analog applications such as high-frequency detection for imaging and sensing, and the input/output isolation afforded by use of a three-terminal device for detection offers considerable advantages for system design, compared to two-terminal devices (e.g. bulky and bandwidth-limiting RF/DC separation circuits are not required). We report here the first experimental demonstration of an III-V interband tunnel FET as an RF detector.
Keywords :
III-V semiconductors; field effect transistors; gallium arsenide; indium compounds; tunnel transistors; tunnelling; III-V interband tunnel FET; InGaAs-GaAsSb; RF detector; TFETs; energy filtering function; high-frequency detection; power-constrained scaling; sub-thermionic switching slopes; system design; three-terminal device; tunable RF detectors; two-terminal devices; Current measurement; Detectors; Logic gates; Radio frequency; Semiconductor device measurement; Sensitivity; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2014 72nd Annual
Conference_Location :
Santa Barbara, CA
Print_ISBN :
978-1-4799-5405-6
Type :
conf
DOI :
10.1109/DRC.2014.6872280
Filename :
6872280
Link To Document :
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