DocumentCode
177732
Title
Corner Detection in Images Under Different Noise Levels
Author
Yi Song ; Yiping Shen ; Shuxiao Li ; Chengfei Zhu ; Jinglan Zhang ; Hongxing Chang
Author_Institution
Integrated Inf. Syst. Res. Center, Inst. of Autom., Beijing, China
fYear
2014
fDate
24-28 Aug. 2014
Firstpage
906
Lastpage
911
Abstract
Corner detection has shown its great importance in many computer vision tasks. However, in real-world applications, noise in the image strongly affects the performance of corner detectors. Few corner detectors have been designed to be robust to heavy noise by now, partly because the noise could be reduced by a denoising procedure. In this paper, we present a corner detector that could find discriminative corners in images contaminated by noise of different levels, without any denoising procedure. Candidate corners (i.e., features) are firstly detected by a modified SUSAN approach, and then false corners in noise are rejected based on their local characteristics. Features in flat regions are removed based on their intensity centroid, and features on edge structures are removed using the Harris response. The detector is self-adaptive to noise since the image signal-to-noise ratio (SNR) is automatically estimated to choose an appropriate threshold for refining features. Experimental results show that our detector has better performance at locating discriminative corners in images with strong noise than other widely used corner or key point detectors.
Keywords
computer vision; image denoising; object detection; Harris response; SNR; computer vision tasks; corner detection; image denoising procedure; intensity centroid; keypoint detectors; local characteristics; modified SUSAN approach; noise levels; real-world applications; signal-to-noise ratio; Detectors; Estimation; Feature extraction; Noise level; Noise measurement; Signal to noise ratio; corner detector; feature detection; noisy image; signal-to-noise ratio;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location
Stockholm
ISSN
1051-4651
Type
conf
DOI
10.1109/ICPR.2014.166
Filename
6976876
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