DocumentCode :
1777396
Title :
SPICE models for metallic all-spin-logic devices and interconnects
Author :
Naeemi, Azad
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2014
fDate :
22-25 June 2014
Firstpage :
287
Lastpage :
288
Abstract :
As Si CMOS technology approaches its scaling limits, there is a global search for novel devices based on state variables other than electronic charge. Among the potential alternative state variables, electron spin has received special attention thanks to its advantages in terms of robustness, non-volatility, and enhanced functionality. Recently, Purdue researchers proposed an all-spin logic (ASL) device that is a derivative of the nonlocal spin-valve structure and accomplishes the five essential characteristics for logic devices: concatenability, nonlinearity, feedback elimination, gain, and a complete set of Boolean operations [1], [2]. Various materials such as metals (copper and aluminum), semiconductors (silicon and gallium arsenide), and even novel carbon-based material such as graphene may be used to implement the channel in an ASL device. Metals are particularly attractive because of their high conductivity, which helps to reduce the “conductivity mismatch” problem [3] prevalent in spin devices with both semiconducting and graphene channels. In this talk, compact models are presented for the spin transport parameters in Cu and Al wires that capture the impact of size effects including surface scattering and grain boundary scattering at nanoscale dimensions [4]. The proposed models have been calibrated with experimental data from mesoscopic lateral spin valves. To model an ASL interconnect, one needs to account for the magnet dynamic, electronic and spintronic transport through magnet to non-magnet interfaces, electric currents, and spin diffusion. A comprehensive set of SPICE models that captures all these effects are described [5]. Finally, the models are used to predict the delay and energy dissipation of ASL devices and interconnects as functions of channel length and cross-sectional dimensions
Keywords :
CMOS logic circuits; SPICE; aluminium; copper; electron spin; grain boundaries; integrated circuit interconnections; integrated circuit modelling; magnetic logic; magnetoelectronics; spin valves; surface scattering; wires; ASL device; ASL interconnect; Boolean operations; SPICE models; aluminum wires; carbon-based material; channel length function; concatenability; conductivity mismatch problem; copper wires; cross-sectional dimensions; delay prediction; electric currents; electron spin; electronic charge; energy dissipation; feedback elimination; gain; grain boundary scattering; graphene; graphene channels; magnet dynamic; mesoscopic lateral spin valves; metallic all-spin-logic devices; nanoscale dimensions; nonlinearity; nonlocal spin-valve structure; nonmagnet interfaces; semiconducting channels; silicon CMOS technology; spin diffusion; spin transport parameters; spintronic transport; state variables; surface scattering; Copper; Electron devices; Integrated circuit interconnections; Logic devices; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2014 72nd Annual
Conference_Location :
Santa Barbara, CA
Print_ISBN :
978-1-4799-5405-6
Type :
conf
DOI :
10.1109/DRC.2014.6872409
Filename :
6872409
Link To Document :
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