• DocumentCode
    177767
  • Title

    Extension of Sparse Randomized Kaczmarz Algorithm for Multiple Measurement Vectors

  • Author

    Aggarwal, H.K. ; Majumdar, A.

  • Author_Institution
    Indraprastha Inst. of Inf. Technol., Delhi, India
  • fYear
    2014
  • fDate
    24-28 Aug. 2014
  • Firstpage
    1014
  • Lastpage
    1019
  • Abstract
    The Kaczmarz algorithm is popular for iteratively solving an over determined system of linear equations. Randomized version of the Kaczmarz algorithm can converge exponentially and independent of number of equations. Recently an algorithm for finding sparse solution to a linear system of equations has been proposed based on weighted randomized Kaczmarz algorithm. These algorithms solves single measurement vector problem, however there are applications where multiple-measurements are available. In this work, the objective is to solve a multiple measurement vector problem with common sparse support by modifying the sparse randomized Kaczmarz algorithm. We have also modeled the problem of face recognition from video as the multiple measurement vector problem and solved using our proposed technique. We have compared the proposed algorithm with state-of-art spectral projected gradient algorithm for multiple measurement vectors on both real and synthetic datasets. The Monte Carlo simulations confirms that our proposed algorithm has better recovery and convergence rate than the MMV version of spectral projected gradient algorithm under fairness constraints.
  • Keywords
    Monte Carlo methods; face recognition; gradient methods; vectors; Monte Carlo simulations; face recognition; linear equations; multiple measurement vector problem; multiple measurement vectors; over determined system; sparse randomized Kaczmarz algorithm; spectral projected gradient algorithm; weighted randomized Kaczmarz algorithm; Equations; Face recognition; Mathematical model; Semiconductor device measurement; Signal processing algorithms; Training; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2014 22nd International Conference on
  • Conference_Location
    Stockholm
  • ISSN
    1051-4651
  • Type

    conf

  • DOI
    10.1109/ICPR.2014.184
  • Filename
    6976894