DocumentCode :
1778151
Title :
Multivariate outlier modeling for capturing customer returns — How simple it can be
Author :
Tikkanen, Jussi ; Sumikawa, N. ; Wang, L.-C. ; Abadir, M.S.
Author_Institution :
UC-Santa Barbara, Santa Barbara, CA, USA
fYear :
2014
fDate :
7-9 July 2014
Firstpage :
164
Lastpage :
169
Abstract :
Univariate outlier analysis has become a popular approach for improving quality. When a customer return occurs, multivariate outlier analysis extends the univariate analysis to develop a test model for preventing similar returns from happening. In this context, this work investigates the following question: How simple multivariate outlier modeling can be? The interest for answering this question are twofold: (1) to facilitate implementation of a test model in test application and (2) to ensure robustness of the methodology. In this work, we explain that based on a Gaussian assumption, a simpler covariance-based outlier analysis approach can be sufficient over a more complex density-based approach such as one-class SVM. We show that correlation among tests can be a good metric to rank potential outlier models. Based on these observations a simple outlier analysis methodology is developed and applied to effectively analyze customer returns from two automotive product lines.
Keywords :
Gaussian processes; automobile industry; covariance analysis; customer satisfaction; quality control; Gaussian assumption; automotive products; covariance; customer returns; multivariate outlier modeling; quality improvement; univariate outlier analysis; Analytical models; Automotive engineering; Correlation; Gaussian distribution; Semiconductor device modeling; Support vector machines; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International
Conference_Location :
Platja d´Aro, Girona
Type :
conf
DOI :
10.1109/IOLTS.2014.6873663
Filename :
6873663
Link To Document :
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