Title :
Two complementary approaches for studying the effects of SEUs on HDL-based designs
Author :
Mansour, Wassim ; Aguirre, M.A. ; Guzman-Miranda, H. ; Barrientos, Jorge ; Velazco, Raoul
Author_Institution :
Lab. TIMA, Univ. Grenoble-Alpes, Grenoble, France
Abstract :
In this paper, a comparison between two HDL-based fault-injection methods, FT-UNSHADES and NETFI, is presented. Fault-injection campaigns were performed on a third party example, named KECCAK sponge function family circuit dedicated for cryptography which is available as an open core. The comparison of both methodologies shows a similarity in the results and enlightens a problem that affects fault-injection systems related to how the synthesis and the simulation is made.
Keywords :
cryptography; fault diagnosis; fault tolerant computing; field programmable gate arrays; hardware description languages; integrated circuit reliability; logic design; radiation hardening (electronics); FT-UNSHADES; HDL-based designs; HDL-based fault-injection methods; KECCAK sponge function family circuit; NETFI; SEU effect; complementary approaches; cryptography; fault tolerant-UNiversity of Sevilla hardware debugging system; fault-injection FPGA emulator; hardware description language; netlist fault injection method; Decision support systems; Testing; Fault Injection; Hardware Description Language; SRAM-based FPGA; Single Event Upsets;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International
Conference_Location :
Platja d´Aro, Girona
DOI :
10.1109/IOLTS.2014.6873702
