Title :
Disadvantages of flat panels for microfocus X-ray systems
Author_Institution :
Teleoptic PRA, Ltd., Kiev, Ukraine
Abstract :
Images captured using standard flat digital detectors for microfocus X-ray systems have some disadvantages (uneven brightness distribution, irregular image resolution and geometrical distortions of the studying object). Using a non-planar detector (in the form of sphere surface part) will improve result image characteristics.
Keywords :
X-ray imaging; brightness; flat panels; geometrical distortions; image characteristics; irregular image resolution; microfocus X-ray systems; sphere surface; standard flat digital detectors; uneven brightness distribution; Brightness; Conferences; Detectors; Image edge detection; Image resolution; Nanotechnology; X-ray imaging; geometrical distortions; image resolution; microfocus x-ray systems; signal intensity; x-ray detector;
Conference_Titel :
Electronics and Nanotechnology (ELNANO), 2014 IEEE 34th International Conference on
Conference_Location :
Kyiv
Print_ISBN :
978-1-4799-4581-8
DOI :
10.1109/ELNANO.2014.6873906
