DocumentCode
1778583
Title
Fractal analysis of the inhomogeneous spatial structures of the boundary lubricating layer in the friction processes
Author
Lyashenko, Iakov ; Manko, Nataliia
Author_Institution
Sumy State Univ., Sumy, Ukraine
fYear
2014
fDate
15-18 April 2014
Firstpage
179
Lastpage
182
Abstract
The synergetic model, that allows representing the processes proceeding at the boundary friction of two atomically smooth surfaces divided by an ultrathin layer of lubricant material is studied. The model is based on the Lorenz system, which is parameterized by shear stresses, shear strain and lubricant film temperature. The spatial inhomogeneity has been considered and it has been shown that a domain structure with two types of domains is formed during the friction process of contact surfaces planes through lubricant. The time dependencies of fractal dimensions of the domain distributions on a plane have been calculated and it has been shown that there is a time point, when fractal dimensions take the minimum values. It has been found, that the system tends to the homogeneous state, in which the same value of the shear stresses specifying the relative rate of the rubbing surfaces, is realized all over the contact plane.
Keywords
abrasion; fractals; friction; inhomogeneous media; internal stresses; lubricants; lubrication; mechanical contact; shear strength; thin films; Lorenz system; atomical smooth surfaces; boundary friction; boundary lubricating layer; contact surface planes; domain distributions; domain structure; fractal analysis; friction process; friction processes; homogeneous state; inhomogeneous spatial structures; lubricant film temperature; rubbing surfaces; shear strain; shear stresses; spatial inhomogeneity; ultrathin lubricant material layer; Equations; Fractals; Friction; Lubricants; Mathematical model; Nonhomogeneous media; Stress; Domain; Fractal analysis; Lorenz system; Spatial structure; Synergetic model;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and Nanotechnology (ELNANO), 2014 IEEE 34th International Conference on
Conference_Location
Kyiv
Print_ISBN
978-1-4799-4581-8
Type
conf
DOI
10.1109/ELNANO.2014.6873940
Filename
6873940
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