Title :
Modeling of metal-dielectric nanocomposite coatings with ferromagnetic inclusions for electromagnetic protection of electronic devices
Author :
Borisova, A. ; Machulyansky, A. ; Yakimenko, Y. ; Bondar, B. ; Bovtun, V. ; Kempa, Martin ; Savinov, M.
Author_Institution :
NTUU Kiev Polytech. Inst., Kiev, Ukraine
Abstract :
Metal-dielectric nanocomposite system with ferromagnetic inclusions was prepared and studied: epoxy resin-xFe (x = 0-30 vol.% is a content of the Fe nanoparticles). Its dielectric and magnetic spectra were measured in a broad frequency range from 106 Hz to 1010 Hz. Both dielectric and magnetic dispersion was observed. Based on the experimental spectra of the complex permittivity and permeability, reflection and transmission coefficients of of the composite layers in a free space were calculated depending on the content of ferromagnetic inclusions and layer thickness. Microwave absorption of the studied metal-dielectric composites varies in a broad rage and can be controlled by changing the concentration of ferromagnetic inclusions. The composites can be used as microwave absorbing or shielding materials.
Keywords :
coatings; ferromagnetic materials; filled polymers; iron; magnetic permeability; microwave spectra; nanocomposites; nanofabrication; nanomagnetics; nanoparticles; permittivity; resins; Fe; composite layers; dielectric dispersion; dielectric spectra; electromagnetic protection; electronic devices; epoxy resin xFe composite; ferromagnetic inclusions; frequency 1000000 Hz to 10000000000 Hz; magnetic dispersion; magnetic spectra; metal-dielectric composites; metal-dielectric nanocomposite coatings; microwave absorption; nanoparticles; permeability; permittivity; reflection coefficients; shielding materials; transmission coefficients; Dielectric measurement; Dielectrics; Iron; Magnetic noise; Magnetic shielding; Materials; Permeability; absorbing materials; ferromagnetic inclusion; metal-dielectric nanocomposites; reflection loss;
Conference_Titel :
Electronics and Nanotechnology (ELNANO), 2014 IEEE 34th International Conference on
Conference_Location :
Kyiv
Print_ISBN :
978-1-4799-4581-8
DOI :
10.1109/ELNANO.2014.6873955