• DocumentCode
    1779146
  • Title

    A novel measurement set up for optical characterization of CMOS photodiodes using immersion oil

  • Author

    Kraxner, Andrea ; Minixhofer, Rainer

  • Author_Institution
    ams AG, Schloss Premstaetten, Austria
  • fYear
    2014
  • fDate
    12-16 Oct. 2014
  • Firstpage
    566
  • Lastpage
    567
  • Abstract
    This novel measurement method is a very simple but efficient improvement of key optical parameter measurements like spectral responsivity. The real photodiode response without interference fringes resulting from the CMOS backend stack can be measured without the expensive and lengthy introduction of antireflective coatings or post-measurement corrections. In addition, the measurement mimics the actual conditions of the photodiodes in applications much better, since often thick optical coatings in transparent packages are used to suppress interference.
  • Keywords
    CMOS integrated circuits; antireflection coatings; oils; photodiodes; CMOS backend stack; CMOS photodiodes; antireflective coatings; immersion oil; measurement set up; optical characterization; optical parameter measurements; post-measurement corrections; spectral responsivity; CMOS integrated circuits; Interference; Optical fibers; Photodiodes; Refractive index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics Conference (IPC), 2014 IEEE
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/IPCon.2014.6995266
  • Filename
    6995266