DocumentCode :
1779146
Title :
A novel measurement set up for optical characterization of CMOS photodiodes using immersion oil
Author :
Kraxner, Andrea ; Minixhofer, Rainer
Author_Institution :
ams AG, Schloss Premstaetten, Austria
fYear :
2014
fDate :
12-16 Oct. 2014
Firstpage :
566
Lastpage :
567
Abstract :
This novel measurement method is a very simple but efficient improvement of key optical parameter measurements like spectral responsivity. The real photodiode response without interference fringes resulting from the CMOS backend stack can be measured without the expensive and lengthy introduction of antireflective coatings or post-measurement corrections. In addition, the measurement mimics the actual conditions of the photodiodes in applications much better, since often thick optical coatings in transparent packages are used to suppress interference.
Keywords :
CMOS integrated circuits; antireflection coatings; oils; photodiodes; CMOS backend stack; CMOS photodiodes; antireflective coatings; immersion oil; measurement set up; optical characterization; optical parameter measurements; post-measurement corrections; spectral responsivity; CMOS integrated circuits; Interference; Optical fibers; Photodiodes; Refractive index;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics Conference (IPC), 2014 IEEE
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/IPCon.2014.6995266
Filename :
6995266
Link To Document :
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