DocumentCode
1779146
Title
A novel measurement set up for optical characterization of CMOS photodiodes using immersion oil
Author
Kraxner, Andrea ; Minixhofer, Rainer
Author_Institution
ams AG, Schloss Premstaetten, Austria
fYear
2014
fDate
12-16 Oct. 2014
Firstpage
566
Lastpage
567
Abstract
This novel measurement method is a very simple but efficient improvement of key optical parameter measurements like spectral responsivity. The real photodiode response without interference fringes resulting from the CMOS backend stack can be measured without the expensive and lengthy introduction of antireflective coatings or post-measurement corrections. In addition, the measurement mimics the actual conditions of the photodiodes in applications much better, since often thick optical coatings in transparent packages are used to suppress interference.
Keywords
CMOS integrated circuits; antireflection coatings; oils; photodiodes; CMOS backend stack; CMOS photodiodes; antireflective coatings; immersion oil; measurement set up; optical characterization; optical parameter measurements; post-measurement corrections; spectral responsivity; CMOS integrated circuits; Interference; Optical fibers; Photodiodes; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics Conference (IPC), 2014 IEEE
Conference_Location
San Diego, CA
Type
conf
DOI
10.1109/IPCon.2014.6995266
Filename
6995266
Link To Document