• DocumentCode
    1779202
  • Title

    Characterizing microdroplet evaporation using diffraction phase microscopy

  • Author

    Edwards, Chris ; Arbabi, Amir ; Bhaduri, Basanta ; Ganti, Raman ; Yunker, Peter J. ; Yodh, Arjun G. ; Popescu, Gabriel ; Goddard, Lynford L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2014
  • fDate
    12-16 Oct. 2014
  • Firstpage
    178
  • Lastpage
    179
  • Abstract
    Diffraction phase microscopy is a non-destructive in-situ characterization tool with nanometer height resolution that can measure 3-dimensional topography. We apply it to characterize microdroplets during evaporation without any a priori assumptions about the droplet geometry.
  • Keywords
    drops; evaporation; microfluidics; micromechanical devices; optical microscopy; surface topography measurement; 3-dimensional topography; diffraction phase microscopy; microdroplet evaporation; nanometer height resolution; nondestructive in-situ characterization tool; Diffraction; Educational institutions; Image resolution; Microscopy; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics Conference (IPC), 2014 IEEE
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/IPCon.2014.6995306
  • Filename
    6995306
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1779202