DocumentCode :
1779249
Title :
Germanium for photonic applications
Author :
Gardes, Frederic Y. ; Littlejohns, Callum G. ; Soler Penades, Jordi ; Mitchell, Colin J. ; Khokhar, Ali Z. ; Reed, Graham T. ; Mashanovich, Goran Z.
Author_Institution :
Optoelectron. Res. Centre, Univ. of Southampton, Southampton, UK
fYear :
2014
fDate :
2-4 June 2014
Firstpage :
139
Lastpage :
140
Abstract :
Localized GOI wires have been grown using a LPE process resulting in single crystal layers up to 400 urn in length and 5 urn in width. We have reported on the design, fabrication and characterisation of a 4-channel AMMI structure integrated with germanium p-i-n photodetectors to form a silicon photonics receiver. Light detection at 50 Gb/s has been demonstrated with a low dark current of <; 20 nA at -1 V bias. The AMMI structure exhibits a low insertion loss of <; -0.5 dB and cross-talk of <; -15 dB across the 4 channels.
Keywords :
elemental semiconductors; germanium; liquid phase epitaxial growth; optical receivers; photodetectors; semiconductor epitaxial layers; semiconductor growth; semiconductor-insulator boundaries; 4-channel AMMI structure; Ge; LPE process; bit rate 50 Gbit/s; cross-talk; crystalline germanium on insulator; dark current; germanium p-i-n photodetectors; insertion loss; light detection; liquid phase epitaxy; localized GOI wires; photonic applications; silicon photonics receiver; single angled multimode interferometer; voltage -1 V; Decision support systems; Detectors; Germanium; Silicon; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon-Germanium Technology and Device Meeting (ISTDM), 2014 7th International
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-5427-8
Type :
conf
DOI :
10.1109/ISTDM.2014.6874667
Filename :
6874667
Link To Document :
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