• DocumentCode
    1779281
  • Title

    Impact of crystalline structure on electrical property of NiGe/Ge contact

  • Author

    Yunsheng Deng ; Nakatsuka, Osamu ; Taoka, Noriyuki ; Zaima, Shigeaki

  • Author_Institution
    Grad. Sch. of Eng., Nagoya Univ., Nagoya, Japan
  • fYear
    2014
  • fDate
    2-4 June 2014
  • Firstpage
    85
  • Lastpage
    86
  • Abstract
    We can control the crystalline structure of NiGe layer on Ge(110) by controlling the deposition method, surface cleaning, and annealing temperature. We also investigated the impact of the interface crystalline structures on the electrical properties of NiGe/Ge(110) contacts. We found that thermal cleaning of Ge surface improves on the interfacial structure of the epitaxial NiGe/Ge(110) contact, that leads to lowering SBH.
  • Keywords
    annealing; crystal structure; elemental semiconductors; germanium; germanium alloys; interface structure; metallic epitaxial layers; nickel alloys; semiconductor-metal boundaries; surface cleaning; vacuum deposition; Ge; Ge(110) surface; NiGe-Ge; annealing; crystalline structure; electrical property; epitaxial contact; interfacial structure; surface cleaning; thermal cleaning; Cleaning; Educational institutions; Electronic mail; Facsimile; Grain boundaries; Lattices; Nickel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon-Germanium Technology and Device Meeting (ISTDM), 2014 7th International
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-5427-8
  • Type

    conf

  • DOI
    10.1109/ISTDM.2014.6874682
  • Filename
    6874682