• DocumentCode
    1779294
  • Title

    High-performance waveguide-integrated germanium PIN photodiodes for optical communication applications

  • Author

    Fedeli, J.M. ; Virot, L. ; Vivien, L. ; Hartmann, J.M. ; Bogumilowicz, Yann ; Marris-Morini, D. ; Cassan, Eric ; Baudot, C. ; Boeuf, F.

  • Author_Institution
    CEA, LETI, Grenoble, France
  • fYear
    2014
  • fDate
    2-4 June 2014
  • Firstpage
    131
  • Lastpage
    132
  • Abstract
    Silicon photonics integrated circuits development considerably spread in the last past years, and telecommunications and datacom applications are now clearly seen as its targets. With the increasing need of data rates, Si photonics components will have to offer very high speed as well as very low power consumption at lowest costs. The recent developments in photodetection have led to high speed and high responsivity waveguide integrated Ge photodetectors [1-3], with various configurations: butt coupling vs. evanescent coupling, vertical vs. lateral PIN junction. Nevertheless, Germanium absorption beyond 1550nm is limited, and long devices are needed, thus prohibiting Ge based photodiode use in the L-band (1565-1625) used in tele-communication. In this paper, we report on our latest development on very low dark current and high speed lateral PIN germanium photodetectors integrated with Si waveguides fabricated on 200mm and 300mm wafer size, for telecom and datacom applications .
  • Keywords
    elemental semiconductors; germanium; optical waveguides; p-i-n photodiodes; photodetectors; silicon; Ge-Si; Si waveguides; dark current; datacom application; high speed lateral PIN germanium photodetectors; high-performance waveguide-integrated germanium PIN photodiodes; optical communication applications; telecom application; wafer size; Bandwidth; Couplers; Loss measurement; Photodiodes; Voltage measurement; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon-Germanium Technology and Device Meeting (ISTDM), 2014 7th International
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-5427-8
  • Type

    conf

  • DOI
    10.1109/ISTDM.2014.6874690
  • Filename
    6874690