DocumentCode :
1779296
Title :
Si-Ge-Sn heterostructures: Growth and applications
Author :
Buca, Dan ; Wirths, Stephan ; Stange, Daniela ; Tiedemann, Andreas T. ; Mussler, Gregor ; Ikonic, Zoran ; Chiussi, S. ; Hartmann, J.M. ; Grutzmacher, D. ; Mantl, Siegfried
Author_Institution :
Peter Grunberg Inst. 9 & JARA - FIT, Forschungszentrum Juelich, Grunberg, Germany
fYear :
2014
fDate :
2-4 June 2014
Firstpage :
163
Lastpage :
164
Abstract :
This study presents the synthesis of a SiGeSn buffer layer by reduced pressure CVD method. Band structure calculation and transmission electron microscopy are used for material characterization. The use of this heterostructure for MOSFET and MOS capacitor fabrication is also addressed.
Keywords :
Ge-Si alloys; MOS capacitors; MOSFET; band structure; buffer layers; chemical vapour deposition; semiconductor growth; semiconductor heterojunctions; semiconductor materials; semiconductor thin films; tin alloys; transmission electron microscopy; MOS capacitor; MOSFET; SiGeSn; band structure; buffer layer; heterostructures; reduced pressure CVD; transmission electron microscopy; Decision support systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon-Germanium Technology and Device Meeting (ISTDM), 2014 7th International
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-5427-8
Type :
conf
DOI :
10.1109/ISTDM.2014.6874691
Filename :
6874691
Link To Document :
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