• DocumentCode
    1779354
  • Title

    1/f noise QWIP infrared focal plane arrays

  • Author

    Gunapala, S.D. ; Rafol, S.B. ; Ting, D.Z. ; Soibel, A. ; Hoeglund, L. ; Hill, C.J. ; Khoshakhlagh, A. ; Liu, J.K. ; Mumolo, J.M. ; Keo, S.A.

  • Author_Institution
    Center for Infrared Photodetectors, California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2014
  • fDate
    12-16 Oct. 2014
  • Firstpage
    344
  • Lastpage
    345
  • Abstract
    Summary form only given. The low-frequency noise (also known as pink noise or flicker noise) is a ubiquitous phenomenon and the spectral power density of this fluctuation process is inversely proportional to the frequency of the signal. In this paper, 1/f noise of 640x512 pixel quantum well infrared photodetectors focal plane arrays (QWIP FPA) is determined by measuring the signal in regular time intervals up to twelve hours. Experimental observations show that this LWIR QWIP FPA´s 1/f noise corner frequency is about 0.1 mHz. The detector pixels completely turned off when ROIC is biased at 4V. Thus, the difference in power spectral densities between 6V and 4V yields the noise spectrum of the QWIPs. The 1/f noise corner frequency of 0.1 mHz is two orders of magnitude better than the previously reported results by Ressler et al.. With this kind of low frequency stability, QWIPs could unveil a new class of infrared applications that have never been imagined before. Furthermore, results from a similar 1/f noise measurement of bulk InAsSb absorber (lattice matched to GaSb substrate) nBn detector array are presented.
  • Keywords
    1/f noise; III-V semiconductors; arsenic compounds; focal planes; indium compounds; infrared detectors; nanophotonics; photodetectors; quantum well devices; 1/f noise QWIP infrared focal plane arrays; InAsSb; LWIR QWIP FPA; absorber; flicker noise; frequency 0.1 mHz; infrared applications; low-frequency noise; nBn detector array; noise spectrum; pink noise; power spectral density; quantum well infrared photodetectors; spectral power density; voltage 4 V to 6 V; 1f noise; Detectors; Extraterrestrial measurements; Noise measurement; Photodetectors; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics Conference (IPC), 2014 IEEE
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/IPCon.2014.6995389
  • Filename
    6995389