DocumentCode :
1779366
Title :
InAs APD with solid state photomultiplier characteristics
Author :
Sandall, Ian ; White, Benjamin ; Chee Hing Tan
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
fYear :
2014
fDate :
12-16 Oct. 2014
Firstpage :
354
Lastpage :
355
Abstract :
InAs, with a bandgap of 0.35 eV can provide excellent light detection across the wavelengths from 1550-3500 nm. When operated as an avalanche photodiode (APD), its excess noise factor remains low at ~1.5 [1], independent of magnitude of the avalanche gain. This can be achieved by ensuring that the field is kept low such that hole impact ionization coefficient remains negligible [2]. Because of its electron-only ionization property, the avalanche duration in InAs electron-APD (e-APD) will be no more than two carrier transit times. Indeed, a very high gain-bandwidth-product of 580 GHz was demonstrated [3]. Therefore InAs e-APD has the potential to be developed into very high speed APD, high speed single photon detector and single photon detector for wavelengths above 1550 nm. In this paper, recent progress in InAs e-APD to achieve these aims is presented.
Keywords :
III-V semiconductors; avalanche photodiodes; indium compounds; photodetectors; photomultipliers; photon counting; APD; InAs; avalanche duration; avalanche photodiode; high gain-bandwidth-product; high speed single photon detector; solid state photomultiplier characteristics; Gain measurement; Monte Carlo methods; Noise; Optimized production technology; Photonic band gap; Photonics; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics Conference (IPC), 2014 IEEE
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/IPCon.2014.6995394
Filename :
6995394
Link To Document :
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