• DocumentCode
    1779366
  • Title

    InAs APD with solid state photomultiplier characteristics

  • Author

    Sandall, Ian ; White, Benjamin ; Chee Hing Tan

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
  • fYear
    2014
  • fDate
    12-16 Oct. 2014
  • Firstpage
    354
  • Lastpage
    355
  • Abstract
    InAs, with a bandgap of 0.35 eV can provide excellent light detection across the wavelengths from 1550-3500 nm. When operated as an avalanche photodiode (APD), its excess noise factor remains low at ~1.5 [1], independent of magnitude of the avalanche gain. This can be achieved by ensuring that the field is kept low such that hole impact ionization coefficient remains negligible [2]. Because of its electron-only ionization property, the avalanche duration in InAs electron-APD (e-APD) will be no more than two carrier transit times. Indeed, a very high gain-bandwidth-product of 580 GHz was demonstrated [3]. Therefore InAs e-APD has the potential to be developed into very high speed APD, high speed single photon detector and single photon detector for wavelengths above 1550 nm. In this paper, recent progress in InAs e-APD to achieve these aims is presented.
  • Keywords
    III-V semiconductors; avalanche photodiodes; indium compounds; photodetectors; photomultipliers; photon counting; APD; InAs; avalanche duration; avalanche photodiode; high gain-bandwidth-product; high speed single photon detector; solid state photomultiplier characteristics; Gain measurement; Monte Carlo methods; Noise; Optimized production technology; Photonic band gap; Photonics; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics Conference (IPC), 2014 IEEE
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/IPCon.2014.6995394
  • Filename
    6995394