DocumentCode :
178001
Title :
Makeup-Invariant Face Recognition by 3D Face: Modeling and Dual-Tree Complex Wavelet Transform from Women´s 2D Real-World Images
Author :
Moeini, A. ; Moeini, H. ; Ayatollahi, F. ; Faez, K.
Author_Institution :
Electr. Eng. Dept., Amirkabir Univ. of Technol., Tehran, Iran
fYear :
2014
fDate :
24-28 Aug. 2014
Firstpage :
1710
Lastpage :
1715
Abstract :
In this paper, a novel feature extraction method is proposed to handle facial makeup in face recognition. To develop a face recognition method robust to facial makeup, features are extracted from face depth in which facial makeup is not effective. Then, face depth features are added to face texture features to perform feature extraction. Accordingly, a 3D face is reconstructed from only a single 2D frontal image with/without facial expressions. Then, the texture and depth of the face are extracted from the reconstructed model. Afterwards, the Dual-Tree Complex Wavelet Transform (DT-CWT) is applied to both texture and reconstructed depth of the face to extract the feature vectors from both texture and reconstructed depth images. Finally, by combining 2D and 3D feature vectors, the final feature vectors are generated and classified by the Support Vector Machine (SVM). Promising results were achieved for makeup-invariant face recognition on the available image database based on the present method compared to several state-of-the-art methods.
Keywords :
face recognition; feature extraction; image classification; image reconstruction; image texture; support vector machines; wavelet transforms; 2D feature vectors; 3D face; 3D face reconstruction; 3D feature vectors; DT-CWT; SVM; dual-tree complex wavelet transform; face depth features; face texture features; facial expressions; feature extraction method; image database; makeup-invariant face recognition method; reconstructed depth images; single 2D frontal image; support vector machine; women 2D real-world images; Face; Face recognition; Feature extraction; Hidden Markov models; Image reconstruction; Solid modeling; Three-dimensional displays; 3D shape recovery; Face recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location :
Stockholm
ISSN :
1051-4651
Type :
conf
DOI :
10.1109/ICPR.2014.301
Filename :
6977012
Link To Document :
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